Rayence unveils a New CMOS Dynamic X-ray Sensor

20180628

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Rayence( www.rayence.com), a leader in digital imaging solutions, showcases a new CMOS dynamic X-ray sensor optimized for non-destructive testing (NDT). The new sensor offers a high speed image acquisition in high-resolution that meets various needs for ‘smart factory’. In addition, Rayence will exhibit a new line of industrial CMOS X-ray sensors in coming months, taking a bigger step into global industrial X-ray inspection system market.  

The newly released sensor is based on CMOS and achieves a high speed without compromising the sensitivity. It features a ‘ultra-bright pixel technology’ that offers high signal-to-noise ratio that can detect even a smallest crack. The sensor offers a high-speed operation required for in-line inspection of smart factory. Capturing images up to 70 fps, it allows high throughput inspection for the most sophisticated electronic components such as PBA and batteries.

Rayence’s industrial sensors have been used widely in aerospace business, post office and military or security in various markets including China, Europe and Japan. During the second half of the year, Rayence have plan to expand their product line-up per application in high-resolution and high-speed. The company expects to bolster its aim at industrial inspection system market

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